36. Comparison of intensity profile analysis and correlation function methods for studying the lamellar structures of semicrystalline polymers using small-angle X-ray scattering
作者：Wang ZG, Hsiao BS, Murthy NS
關鍵字：相關函數法，散射強度法，片晶厚度
論文來源：期刊
具體來源：Journal of Applied Crystallography, 2000, 33 (1), 690-694.
發表時間：2000年
暫無